发明名称 METHOD FOR PRODUCING SEMICONDUCTOR DEVICE
摘要 <p>Provided is a semiconductor device manufacturing method, comprising forming a first sacrificial layer that contacts at least a portion of a first semiconductor layer and has a higher solid solubility for impurities included in the first semiconductor layer than the first semiconductor layer; annealing the first sacrificial layer and the first semiconductor layer; removing the first sacrificial layer through a wet process; after removing the first sacrificial layer, performing at least one of forming an insulating layer that covers at least a portion of the first semiconductor layer and etching a portion of the first semiconductor layer; and forming an electrode layer that is electrically connected to the first semiconductor layer.</p>
申请公布号 EP2662886(A4) 申请公布日期 2015.07.29
申请号 EP20120739200 申请日期 2012.01.23
申请人 FURUKAWA ELECTRIC CO., LTD.;NATIONAL UNIVERSITY CORPORATION TOHOKU UNVERSITY 发明人 KAMBAYASHI, HIROSHI;TERAMOTO, AKINOBU;OHMI, TADAHIRO
分类号 H01L29/778;H01L21/306;H01L21/336;H01L21/338;H01L29/20;H01L29/423;H01L29/51 主分类号 H01L29/778
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