发明名称 Device for the detection of temperature variations in a chip
摘要 <p>The device has implanted resistors (41, 43, 45, 47) connected as a Wheatstone bridge. First two opposite resistors (45, 47) of the bridge is covered with an array of metal lines parallel to a direction. The direction is such that a variation in the substrate stress along the direction causes a variation of an unbalance voltage (V OUT) of the bridge. Second opposite resistors is covered with an array of metal lines parallel to another direction orthogonal to the former direction. The metal lines are made of copper or aluminum.</p>
申请公布号 EP2306167(B1) 申请公布日期 2015.07.29
申请号 EP20100185175 申请日期 2010.10.01
申请人 STMICROELECTRONICS (ROUSSET) SAS 发明人 RIVERO, CHRISTIAN
分类号 G01K5/48;G01K7/22 主分类号 G01K5/48
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