发明名称 CALIBRATION CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
摘要 <p>The present invention relates to a calibration circuit which comprises: a pad where toggling calibration data is inputted; a calibration reference voltage generation unit which is inputted with at least one of the calibration data, in order to generate calibration reference voltage from a median value of the calibration data; a comparison unit which compares the calibration reference voltage with reference voltage in order to output a comparison signal; and a reference voltage generation unit which generates the reference voltage corresponding to the comparison signal. The purpose of the present invention is to provide a semiconductor device which can perform calibration at the reference voltage by including the calibration circuit.</p>
申请公布号 KR20150086701(A) 申请公布日期 2015.07.29
申请号 KR20140006688 申请日期 2014.01.20
申请人 SK HYNIX INC. 发明人 HYUN, SANG AH;LEE, HYUN WOO
分类号 G05F3/02 主分类号 G05F3/02
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