发明名称 |
CALIBRATION CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME |
摘要 |
<p>The present invention relates to a calibration circuit which comprises: a pad where toggling calibration data is inputted; a calibration reference voltage generation unit which is inputted with at least one of the calibration data, in order to generate calibration reference voltage from a median value of the calibration data; a comparison unit which compares the calibration reference voltage with reference voltage in order to output a comparison signal; and a reference voltage generation unit which generates the reference voltage corresponding to the comparison signal. The purpose of the present invention is to provide a semiconductor device which can perform calibration at the reference voltage by including the calibration circuit.</p> |
申请公布号 |
KR20150086701(A) |
申请公布日期 |
2015.07.29 |
申请号 |
KR20140006688 |
申请日期 |
2014.01.20 |
申请人 |
SK HYNIX INC. |
发明人 |
HYUN, SANG AH;LEE, HYUN WOO |
分类号 |
G05F3/02 |
主分类号 |
G05F3/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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