发明名称 形状測定装置及び形状測定方法
摘要 <p>A contact type prove achieves a high-precision measurement of a shape of even a steeply-inclined surface in the vicinity of vertical by controlling a contact force stably. In a shape measuring method for measuring the shape of the surface of a measured object by moving a contact type probe along the surface of the measured object, a slope of the measured object surface is estimated depending on the magnitude of a component force of the contact force applied to the probe and when it is determined that the slope is in the vicinity of vertical, a probe supporting unit is moved in a direction perpendicular to the moving direction of the probe supporting unit.</p>
申请公布号 JP5754971(B2) 申请公布日期 2015.07.29
申请号 JP20110028716 申请日期 2011.02.14
申请人 发明人
分类号 G01B5/20 主分类号 G01B5/20
代理机构 代理人
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