发明名称 Fault isolation with abstracted objects
摘要 In response to a notification of a fault captured in a system, a fault isolator serially analyzes each clock object to determine captured faults associated with the clock object. For each of the clock objects determined to have a captured fault, the fault isolator initiates a repair action for the chip represented by the clock object. The fault isolator concurrently analyzes the non-clock objects to determine captured faults associated with the non-clock objects after analysis of the clock objects. For each of the non-clock objects determined to have a captured fault, the fault isolator initiates a repair action for the chip represented by the non-clock object.
申请公布号 US9092333(B2) 申请公布日期 2015.07.28
申请号 US201313734094 申请日期 2013.01.04
申请人 International Business Machines Corporation 发明人 Phan Christopher Tung;Shelley Zane Coy
分类号 G06F11/00;G06F11/07;G06F11/22 主分类号 G06F11/00
代理机构 DeLizio Gilliam, PLLC 代理人 DeLizio Gilliam, PLLC
主权项 1. A method comprising: generating, for each of a plurality of chips in a system, a clock object and a non-clock object, wherein the clock object indicates at least one of data and program code for clock related functionality of the chip and the non-clock object indicates at least one of data and program code for functionality of the chip that is not related to clock functionality; in response to a notification of a fault captured in the system, serially analyzing each of the clock objects to determine captured faults associated with the clock objects;for each of the clock objects determined to have a captured fault, initiating a repair action for the chip represented by the clock object; andafter said serially analyzing each of the clock objects, concurrently analyzing the non-clock objects to determine captured faults associated with the non-clock objects;for each of the non-clock objects determined to have a captured fault, initiating a repair action for the chip represented by the non-clock object.
地址 Armonk NY US