发明名称 Method and apparatus for measuring performance of electronic device
摘要 A method and an apparatus for measuring performance of an electronic device are provided. The apparatus includes an electromagnetic wave measuring device for measuring an actual level of an electromagnetic wave of an electronic device, and an analysis controller for applying a previously stored level change value to the actual level of the electromagnetic wave to compute a measured level of the electromagnetic wave. The method and the apparatus for measuring performance of an electronic device can easily measure an electromagnetic wave level of the electronic device without using a device suggested by an international standard.
申请公布号 US9091716(B2) 申请公布日期 2015.07.28
申请号 US201213644793 申请日期 2012.10.04
申请人 Samsung Electronics Co., Ltd. 发明人 Kim Jungmin;Seo Keonyoung;Yang Kwangmo;Kang Byeonghwan;Park Bonghee
分类号 G01R31/00;H04M1/24 主分类号 G01R31/00
代理机构 Jefferson IP Law, LLP 代理人 Jefferson IP Law, LLP
主权项 1. A method of measuring performance of an electronic device, the method comprising: obtaining a relationship equation between an electromagnetic level measured by a first measuring device and an electromagnetic level measured by a second measuring device; measuring a first electromagnetic wave level of a measurement target electronic device by the second measuring device; and obtaining a second electromagnetic wave level of the measurement target electronic device based on the measured first electromagnetic wave level and the relationship equation.
地址 Suwon-si KR