发明名称 |
Semiconductor device manufacturing and processing methods and apparatuses for forming a film |
摘要 |
A semiconductor device manufacturing method includes: accommodating a substrate in a processing chamber; and supplying a silicon-based gas and an amine-based gas into the processing chamber that is heated to form a film including silicon and carbon on the substrate. The forming of the film including silicon and carbon includes: supplying the silicon-based gas and the amine-based gas into the processing chamber and confining the silicon-based gas and the amine-based gas in the processing chamber; maintaining a state in which the silicon-based gas and the amine-based gas are confined in the processing chamber, and exhausting an inside of the processing chamber. |
申请公布号 |
US9090969(B2) |
申请公布日期 |
2015.07.28 |
申请号 |
US201213529373 |
申请日期 |
2012.06.21 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
Takeda Tsuyoshi;Sato Taketoshi |
分类号 |
H01R11/01;C23C16/30;C23C16/32;C23C16/36;C23C16/44;C23C16/455;H01L21/02 |
主分类号 |
H01R11/01 |
代理机构 |
Oliff PLC |
代理人 |
Oliff PLC |
主权项 |
1. A semiconductor device manufacturing method comprising:
accommodating a substrate in a processing chamber; and supplying a silicon-based gas and an amine-based gas into the processing chamber that is heated to form a film including silicon and carbon on the substrate, wherein; (i) the forming of the film including silicon and carbon includes:
supplying the silicon-based gas and the amine-based gas into the processing chamber and confining the silicon-based gas and the amine-based gas in the processing chamber;maintaining a state in which the silicon-based gas and the amine-based gas are confined in the processing chamber, andexhausting an inside of the processing chamber; and (ii) in the forming of the film including silicon and carbon, an atomic concentration of carbon in the film including silicon and carbon is controlled according to a time when the state in which the silicon-based gas and the amine-based gas are confined in the processing chamber is maintained. |
地址 |
Tokyo JP |