发明名称 Semiconductor device manufacturing and processing methods and apparatuses for forming a film
摘要 A semiconductor device manufacturing method includes: accommodating a substrate in a processing chamber; and supplying a silicon-based gas and an amine-based gas into the processing chamber that is heated to form a film including silicon and carbon on the substrate. The forming of the film including silicon and carbon includes: supplying the silicon-based gas and the amine-based gas into the processing chamber and confining the silicon-based gas and the amine-based gas in the processing chamber; maintaining a state in which the silicon-based gas and the amine-based gas are confined in the processing chamber, and exhausting an inside of the processing chamber.
申请公布号 US9090969(B2) 申请公布日期 2015.07.28
申请号 US201213529373 申请日期 2012.06.21
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 Takeda Tsuyoshi;Sato Taketoshi
分类号 H01R11/01;C23C16/30;C23C16/32;C23C16/36;C23C16/44;C23C16/455;H01L21/02 主分类号 H01R11/01
代理机构 Oliff PLC 代理人 Oliff PLC
主权项 1. A semiconductor device manufacturing method comprising: accommodating a substrate in a processing chamber; and supplying a silicon-based gas and an amine-based gas into the processing chamber that is heated to form a film including silicon and carbon on the substrate, wherein; (i) the forming of the film including silicon and carbon includes: supplying the silicon-based gas and the amine-based gas into the processing chamber and confining the silicon-based gas and the amine-based gas in the processing chamber;maintaining a state in which the silicon-based gas and the amine-based gas are confined in the processing chamber, andexhausting an inside of the processing chamber; and (ii) in the forming of the film including silicon and carbon, an atomic concentration of carbon in the film including silicon and carbon is controlled according to a time when the state in which the silicon-based gas and the amine-based gas are confined in the processing chamber is maintained.
地址 Tokyo JP