发明名称 Sealing inspection device and sealing inspection method of flat panel display apparatus by using the sealing inspection device
摘要 A sealing inspection device for detecting a bonding error at a sealing region of an upper and a lower plate in a flat panel display apparatus in which the upper and lower plates are bonded to each other by a sealing member, the sealing inspection device includes a light source configured to emit light, a polarizer configured to polarize the light emitted from the light source, the polarized light being incident on and reflected from the sealing region of the flat panel display, an optical spectrum analyzer configured to analyze the light reflected from the sealing region with respect to wavelength ranges and to determine whether a bonding error exits at the sealing region, and a beam splitter configured to change a path of the reflected light toward the optical spectrum analyzer.
申请公布号 US9093662(B2) 申请公布日期 2015.07.28
申请号 US201113137893 申请日期 2011.09.21
申请人 SAMSUNG DISPLAY CO., LTD. 发明人 Park Soon-Ryong;Jung Woo-Suk;Jeong Hee-Seong;Kim Tae-Kyu;Kim Sun-Hwa
分类号 G01J4/00;H01L51/52;G02F1/13;G02F1/1339 主分类号 G01J4/00
代理机构 Lee & Morse, P.C. 代理人 Lee & Morse, P.C.
主权项 1. A sealing inspection device for detecting a bonding error at a cured sealing region between an upper and a lower plate in a flat panel display apparatus in which the upper and lower plates are bonded to each other by a sealing member, the sealing inspection device comprising: a light source emitting light; a polarizer polarizing the light emitted from the light source, the polarized light being incident on and reflected from the cured sealing region of the flat panel display; an optical spectrum analyzer configured to analyze the light reflected from the sealing region with respect to wavelength ranges to determine whether a bonding error exists at the sealing region based on measurement by the optical spectrum analyzer of the reflectance of the reflected light with respect to the wavelength ranges, and comparing the measured reflectance to a reference value to determine whether the bonding error exists at the cured sealing region; and a beam splitter configured to change a path of the reflected light toward the optical spectrum analyzer.
地址 Yongin, Gyeonggi-Do KR