发明名称 |
Process for fabricating gallium arsenide devices with copper contact layer |
摘要 |
Systems, apparatuses, and methods related to the design, fabrication, and manufacture of gallium arsenide (GaAs) integrated circuits are disclosed. Copper can be used as the contact material for a GaAs integrated circuit. Metallization of the wafer and through-wafer vias can be achieved through copper plating processes disclosed herein. Various protocols can be employed during processing to avoid cross-contamination between copper-plated and non-copper-plated wafers. GaAs integrated circuits can be singulated, packaged, and incorporated into various electronic devices. |
申请公布号 |
US9093506(B2) |
申请公布日期 |
2015.07.28 |
申请号 |
US201213466792 |
申请日期 |
2012.05.08 |
申请人 |
SKYWORKS SOLUTIONS, INC. |
发明人 |
Shen Hong |
分类号 |
H01L21/288;H01L23/532;H01L21/768;H01L23/482;H01L23/495;H01L21/683;H01L23/00;H01L21/56 |
主分类号 |
H01L21/288 |
代理机构 |
Knobbe Martens Olson and Bear LLP |
代理人 |
Knobbe Martens Olson and Bear LLP |
主权项 |
1. A method of manufacturing a GaAs integrated circuit including a copper backside, said method comprising:
identifying a lot of GaAs wafers configured to receive a copper backside, each of the wafers mounted on a respective carrier; depositing a desired thickness of copper on a backside of each of the GaAs wafers; forming a scribing street by removing a portion of said copper from each of the GaAs wafers; depositing a protective layer of conductive material on the backside of each of the GaAs wafers; and debonding each of the GaAs wafers from said respective carrier. |
地址 |
Woburn MA US |