Method and system for determining void pantograph settings

摘要

A method and system for determining void pantograph settings is presented. The method includes obtaining electronic images of one or more predefined test sheets having a plurality of void pantograph settings, modeling one or more regions of the electronic images, predicting the sensitivity of the plurality of void pantograph settings to a print/scan process, the predicting being based at least in part on the one or modeled regions, and identifying characteristics for a candidate void pantograph setting using the prediction step results. The system includes a controller, a modeling unit, a measuring unit and a prediction unit configured to perform a method in accordance with an embodiment of the invention. A computer readable medium containing executable instructions is also described.

主权项

1. A method for determining void pantograph settings, the method comprising:
obtaining electronic images of one or more predefined physical test sheets having a plurality of void pantograph settings printed thereon; modeling one or more regions of the electronic images of the predefined physical test sheets on which the void pantograph settings have been printed; predicting the sensitivity of the void pantograph settings to a print/scan process, the predicting being based at least in part on the one or more modeled regions of the electronic images of the predefined physical test sheets on which the void pantograph settings have been printed; and identifying characteristics for a candidate void pantograph setting from the predicted sensitivity of the void pantograph settings printed on the predefined physical test sheets of which the electronic images have been obtained.