SEMICONDUCTOR DEVICE ENABLING LOW POWER SCAN TEST AND METHOD FOR TESTING THE SAME

摘要

The present invention relates to a semiconductor device and a method for testing the same. According to an embodiment of the present invention, the semiconductor device can comprise: a plurality of scan chains including a plurality of dependently connected scan cells; a plurality of clock gating cells to control whether a clock is applied to the scan cells; and a clock controller to control the clock gating cells in order to block the clock with respect to scan cells contained in at least one dummy scan chain according to a test pattern input to the scan chain.