Multi-functional online testing system for semiconductor light-emitting devices or modules and method thereof

摘要

The disclosure provides a system and method for multi-functional online testing of semiconductor light-emitting devices or modules. The system includes an electrical characteristic generating and testing equipment, one or more optical characteristic detecting and controlling equipments, an optical signal processing and analyzing equipment, one or more thermal characteristic detecting equipments, a central monitoring and processing computer, a multi-channel integrated drive controlling equipment, one or more multi-stress accelerated degradation controlling equipments, and one or more load boards. The present disclosure enables in-situ online monitoring and testing under accelerated degradation in a multi-stress accelerated degradation environment.

主权项

1. A system for multi-functional online testing of semiconductor light-emitting devices or modules, comprising:
one or more load boards configured to accommodate one or more semiconductor light-emitting devices or modules of different types; one or more optical characteristic detecting and controlling equipments each configured to convert optical signals received from corresponding ones of the one or more semiconductor light-emitting devices or modules into electrical signals; an optical processing and analyzing equipment connected with the one or more optical characteristic detecting and controlling equipments and configured to process and analyze the electrical signals output from the one or more optical characteristic detecting and controlling equipments to obtain optical characteristics of the semiconductor light-emitting devices or modules; one or more thermal characteristic detecting equipments each connected with a corresponding one of the one or more load boards and configured to detect thermal characteristics of corresponding ones of the one or more semiconductor light-emitting devices or modules, the thermal characteristics comprising one or more of thermal resistance, junction temperature, and spatial distribution of temperature; one or more multi-stress accelerated degradation controlling equipments each connected with a corresponding one of the one or more load boards and configured to provide a multi-stress accelerated degradation environment to corresponding ones of the one or more semiconductor light-emitting devices or modules, the multi-stress accelerated degradation environment comprising a constant case temperature, humidity, and light radiation; an electrical characteristic generating and testing equipment connected with the one or more load boards and configured to provide electrical signals for turning on the one or more semiconductor light-emitting devices or modules, apply electrical stresses on the one or more semiconductor light-emitting devices or modules, and measure electrical characteristics of the respective semiconductor light-emitting devices or modules; a multi-channel integrated drive controlling equipment connected with the electrical characteristic generating and testing equipment and the one or more load boards and configured to provide a stimulus source to the one or more semiconductor light-emitting devices or modules and switch signal channels between the one or more load boards in such a way that different semiconductor light-emitting devices or modules are independently subjected to accelerated degradation under different electrical stress conditions; and a central monitoring and processing computer connected with the electrical characteristic generating and testing equipment, the optical signal processing and analyzing equipment, the multi-channel integrated drive controlling equipment, the one or more multi-stress accelerated degradation controlling equipments, and the one or more thermal characteristic detecting equipments, and configured to control transfer, collection, and analysis of data.