发明名称 Methods for testing receiver sensitivity of wireless electronic devices
摘要 A test system may include test equipment for testing the radio-frequency performance of wireless electronic devices. The test equipment may provide radio-frequency downlink signals to a wireless electronic device under test (DUT). The test equipment may perform a power sweep by stepping down the downlink signals in signal power level to test receiver sensitivity for the DUT. The DUT may gather measurement data from the downlink signals. The test equipment may retrieve measurement data from the DUT after downlink signal transmission has ended. The test equipment may identify a trigger in the retrieved measurement data to ensure that the data is synchronized with the power sweep in the transmitted downlink signals. The test equipment may identify path loss information associated with the test system. The test equipment may compute receiver sensitivity values for the DUT based on the path loss information and retrieved measurement data.
申请公布号 US9094840(B2) 申请公布日期 2015.07.28
申请号 US201313738506 申请日期 2013.01.10
申请人 Apple Inc. 发明人 Liu Song;Takeya Tomoki;Syed Adil;Venkataraman Vishwanath
分类号 H04W24/00 主分类号 H04W24/00
代理机构 Treyz Law Group 代理人 Treyz Law Group ;Lyons Michael H.
主权项 1. A method of using a test system to test a device under test, comprising: with the test system, transmitting radio-frequency test signals at a plurality of power levels to the device under test, wherein the radio-frequency test signals include a test trigger signal having a test trigger duration; with the test system, receiving test data from the device under test, wherein the test data includes a measured trigger signal having a measured trigger duration; with the test system, determining whether the test data is synchronized with the test signals by comparing the measured trigger signal to the test trigger signal; with the test system, computing a difference between the measured trigger duration and the test trigger duration; and comparing the difference to a predetermined threshold to determine whether the test data is synchronized with the test signal.
地址 Cupertino CA US