发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device having achieved a miniaturization while reducing a failure, or provide a semiconductor device having achieved the miniaturization while retaining excellent characteristics.SOLUTION: A semiconductor device includes: source wiring and drain wiring respectively including a first conductive layer and a second conductive layer having film thickness smaller than that of the first conductive layer; an insulating layer having an opening and provided on the source wiring and the drain wiring; an oxide semiconductor layer provided on the insulating layer and in contact with a part of the second conductive layer of the source wiring or the drain wiring at the opening; a gate insulating layer provided on the oxide semiconductor layer; and a gate electrode provided on the gate insulating layer. |
申请公布号 |
JP2015135989(A) |
申请公布日期 |
2015.07.27 |
申请号 |
JP20150080617 |
申请日期 |
2015.04.10 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI |
分类号 |
H01L29/786;H01L21/28;H01L21/336;H01L21/8234;H01L21/8242;H01L21/8247;H01L27/06;H01L27/08;H01L27/088;H01L27/105;H01L27/108;H01L27/115;H01L27/146;H01L29/417;H01L29/788;H01L29/792 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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