| 摘要 |
<p>A non-contact magnetic particle inspection apparatus (2) includes a test article support and manipulation system (34) having a first rail (38) that extends along a first axis, a second rail (39) that extends along the first axis, and a third rail (70) that extends a second axis. The third rail (70) includes a first end (41, 47, 72) that extends to a second end (42, 48, 73) through an intermediate portion (43, 49, 74). The first end (41, 47, 72) is mounted to the first rail (38) and the second end (42, 48, 73) is mounted to the second rail (39). A mounting fixture (90) is mounted to the third rail (70). The mounting fixture (90) includes a test article mounting system (93) and a test article orientation system (95). The test article orientation system (95) is configured and disposed to selectively manipulate a test article (114) within a magnetic field (25).</p> |
