发明名称 |
ANGLE CALIBRATION FOR GRAZING-INCIDENCE X-RAY FLUORESCENCE (GIXRF) |
摘要 |
A method includes directing an X-ray beam to be incident at a grazing angle on a location on a surface of the sample. An X-ray fluorescence excited at the location is measured. A reflection angle of the X-ray beam from the surface and a transmission angle of the X-ray beam are measured. An angle of incidence of the X-ray beam on the surface is evaluated using the measured reflection and transmission angles, and the measured X-ray fluorescence is analyzed using the evaluated angle of incidence. |
申请公布号 |
US2015204806(A1) |
申请公布日期 |
2015.07.23 |
申请号 |
US201414555613 |
申请日期 |
2014.11.27 |
申请人 |
JORDAN VALLEY SEMICONDUCTORS LTD. |
发明人 |
Mazor Isaac;Peled Asher |
分类号 |
G01N23/223;G01N23/207 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
|
主权项 |
1. A method for analysis of a sample, comprising:
directing an X-ray beam to be incident at a grazing angle on a location on a surface of the sample; measuring X-ray fluorescence excited at the location; measuring a reflection angle of the X-ray beam from the surface and a transmission angle of the X-ray beam; evaluating an angle of incidence of the X-ray beam on the surface using the measured reflection and transmission angles; and analyzing the measured X-ray fluorescence using the evaluated angle of incidence. |
地址 |
Migdal HaEmek IL |