发明名称 ANGLE CALIBRATION FOR GRAZING-INCIDENCE X-RAY FLUORESCENCE (GIXRF)
摘要 A method includes directing an X-ray beam to be incident at a grazing angle on a location on a surface of the sample. An X-ray fluorescence excited at the location is measured. A reflection angle of the X-ray beam from the surface and a transmission angle of the X-ray beam are measured. An angle of incidence of the X-ray beam on the surface is evaluated using the measured reflection and transmission angles, and the measured X-ray fluorescence is analyzed using the evaluated angle of incidence.
申请公布号 US2015204806(A1) 申请公布日期 2015.07.23
申请号 US201414555613 申请日期 2014.11.27
申请人 JORDAN VALLEY SEMICONDUCTORS LTD. 发明人 Mazor Isaac;Peled Asher
分类号 G01N23/223;G01N23/207 主分类号 G01N23/223
代理机构 代理人
主权项 1. A method for analysis of a sample, comprising: directing an X-ray beam to be incident at a grazing angle on a location on a surface of the sample; measuring X-ray fluorescence excited at the location; measuring a reflection angle of the X-ray beam from the surface and a transmission angle of the X-ray beam; evaluating an angle of incidence of the X-ray beam on the surface using the measured reflection and transmission angles; and analyzing the measured X-ray fluorescence using the evaluated angle of incidence.
地址 Migdal HaEmek IL