发明名称 NORMAL TEMPERATURE BONDING DEVICE
摘要 The normal temperature bonding device is equipped with a bonding chamber, an upper side stage mechanism whereby an upper side wafer is supported in such a way as to be vertically movable inside the bonding chamber, and a lower side stage mechanism whereby a lower side wafer is supported in such a way as to be movable within a horizontal plane inside the bonding chamber. The lower side stage mechanism comprises a carriage having a lower side wafer holding part for holding the lower side wafer, an elastic guide coupled to the carriage and supporting the carriage, a positioning stage for coarsely moving the lower side wafer holding part, a fine movement mechanism for finely moving the lower side wafer holding part, and a carriage support block. The elastic guide supports the carriage in such a manner that the carriage does not come into contact with the carriage support block when no load is being applied from the upper side stage mechanism onto the carriage, and elastically deforms so that the carriage comes into contact with the carriage support block when the upper side stage mechanism brings the upper side wafer into contact with the lower side wafer, thereby applying a vertical load onto the carriage.
申请公布号 WO2015107855(A1) 申请公布日期 2015.07.23
申请号 WO2014JP84495 申请日期 2014.12.26
申请人 MITSUBISHI HEAVY INDUSTRIES, LTD. 发明人 KINOUCHI MASATO;GOTO TAKAYUKI;TSUNO TAKESHI;IDE KENSUKE;SUZUKI TAKENORI
分类号 H01L21/02;B23K20/00;H01L21/68;H01L21/683 主分类号 H01L21/02
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