TESTING OF DEVICES WITH MULTIPLE INTERFACES USING A SINGLE MULTI-PIN CABLE

摘要

A variety of device interfaces may be connected to a test platform in a fast and efficient manner using multi-pin cables and connectors to support high-volume processing of devices to be tested. The multi-pin cables and connectors may aggregate a plurality of specific device interfaces into a single cable that can be connected via a connector to a test shelf and via a connector to a test platform, reducing the time to setup for device testing and facilitating high-volume processing of devices to be tested.