发明名称 SPECIMEN INSPECTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a specimen inspection device for inspecting a state of a subject of a plate capable of confirming a state of the subject again even after performing the inspection.SOLUTION: A specimen inspection device 1 includes: a plate set part 2; light sources 31 to 33; an imaging part 4; a touch panel type display part 8; a storage part 9; and an output part 10. The plate set part 2 sets a plate 12 having a plurality of wells in which a subject is stored. The light sources 31 to 33 irradiate light to the plate 12 set in the plate set part 2. The imaging part 4 images the plate 12 which is set in the plate set part 2. The touch panel type display part 8 displays image data acquired by imaging with the imaging part 4 and can detect a touch position at the time of touching a position determining that a state change of the subject is generated. The storage part 9 stores inspection data of the state change due to the touch at the display part 8, the image data, and identification data of the plate 12 in association. The output part 10 outputs the inspection data and the image data stored in the storage part 9.</p>
申请公布号 JP2015132550(A) 申请公布日期 2015.07.23
申请号 JP20140004360 申请日期 2014.01.14
申请人 KODEN KOGYO KK 发明人 SUGINO YUICHI;ISHIDA YOSHINOBU
分类号 G01N21/27 主分类号 G01N21/27
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