发明名称 CALIBRATION CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
摘要 A calibration circuit includes a pad suitable for receiving calibration data that toggles, a calibration reference voltage generation unit suitable for generating a calibration reference voltage from a median value of the calibration data, a comparison unit suitable for outputting a comparison signal by comparing the calibration reference voltage and a reference voltage with each other, and a reference voltage generation unit suitable for generating the reference voltage which is calibrated based on the comparison signal.
申请公布号 US2015205312(A1) 申请公布日期 2015.07.23
申请号 US201414308508 申请日期 2014.06.18
申请人 SK hynix Inc. 发明人 HYUN Sang-Ah;LEE Hyun-Woo
分类号 G05F1/46 主分类号 G05F1/46
代理机构 代理人
主权项 1. A calibration circuit, comprising: a pad suitable for receiving a calibration data that toggles; a calibration reference voltage generation unit suitable for generating a calibration reference voltage from a median value of the calibration data; a comparison unit suitable for outputting a comparison signal by comparing the calibration reference voltage and a reference voltage with each other; and a reference voltage generation unit suitable for generating the reference voltage which is calibrated based on the comparison signal.
地址 Gyeonggi-do KR
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