发明名称 |
CALIBRATION CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME |
摘要 |
A calibration circuit includes a pad suitable for receiving calibration data that toggles, a calibration reference voltage generation unit suitable for generating a calibration reference voltage from a median value of the calibration data, a comparison unit suitable for outputting a comparison signal by comparing the calibration reference voltage and a reference voltage with each other, and a reference voltage generation unit suitable for generating the reference voltage which is calibrated based on the comparison signal. |
申请公布号 |
US2015205312(A1) |
申请公布日期 |
2015.07.23 |
申请号 |
US201414308508 |
申请日期 |
2014.06.18 |
申请人 |
SK hynix Inc. |
发明人 |
HYUN Sang-Ah;LEE Hyun-Woo |
分类号 |
G05F1/46 |
主分类号 |
G05F1/46 |
代理机构 |
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代理人 |
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主权项 |
1. A calibration circuit, comprising:
a pad suitable for receiving a calibration data that toggles; a calibration reference voltage generation unit suitable for generating a calibration reference voltage from a median value of the calibration data; a comparison unit suitable for outputting a comparison signal by comparing the calibration reference voltage and a reference voltage with each other; and a reference voltage generation unit suitable for generating the reference voltage which is calibrated based on the comparison signal. |
地址 |
Gyeonggi-do KR |