发明名称 |
Body-Tied, Strained-Channel Multi-Gate Device and Methods of Manufacturing Same |
摘要 |
A fin-FET or other multi-gate transistor is disclosed. The transistor comprises a semiconductor substrate having a first lattice constant, and a semiconductor fin extending from the semiconductor substrate. The fin has a second lattice constant, different from the first lattice constant, and a top surface and two opposed side surfaces. The transistor also includes a gate dielectric covering at least a portion of the top surface and the two opposed side surfaces, and a gate electrode covering at least a portion of the gate dielectric. The resulting channel has a strain induced therein by the lattice mismatch between the fin and the substrate. This strain can be tuned by selection of the respective materials. |
申请公布号 |
US2015206970(A1) |
申请公布日期 |
2015.07.23 |
申请号 |
US201514607977 |
申请日期 |
2015.01.28 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Lin Hong-Nien;Lin Horng-Chih;Huang-Yu Tiao-Yuan |
分类号 |
H01L29/78;H01L29/66;H01L29/165;H01L29/16;H01L29/161 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A device comprising:
a semiconductor substrate having a first lattice constant; a semiconductor fin extending directly and continuously from a top surface of the semiconductor substrate, the having a second lattice constant, the second lattice constant being different from the first lattice constant, the fin having a bottom surface disposed directly on the top surface of the semiconductor substrate, an opposite top surface and two opposed side surfaces, wherein the difference in lattice constants creates a bi-axial compressive strain in the semiconductor fin at an interface between the top surface of the semiconductor substrate and the bottom surface of the fin; a gate dielectric covering at least a portion of the top surface and the two opposed side surfaces; and a gate electrode covering at least a portion of the gate dielectric. |
地址 |
Hsin-Chu TW |