发明名称 |
METHODS OF OPERATING A MEMORY DEVICE HAVING A BURIED BOOSTING PLATE |
摘要 |
Memory devices are disclosed, such as those that include a semiconductor-on-insulator (SOI) NAND memory array having a boosting plate. The boosting plate may be disposed in an insulator layer of the SOI substrate such that the boosting plate exerts a capacitive coupling effect on a p-well of the memory array. Such a boosting plate may be used to boost the p-well during program and erase operations of the memory array. During a read operation, the boosting plate may be grounded to minimize interaction with p-well. Systems including the memory array and methods of operating the memory array are also disclosed. |
申请公布号 |
US2015206592(A1) |
申请公布日期 |
2015.07.23 |
申请号 |
US201414159198 |
申请日期 |
2014.01.20 |
申请人 |
Micron Technology, Inc. |
发明人 |
Goda Akira |
分类号 |
G11C16/34 |
主分类号 |
G11C16/34 |
代理机构 |
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代理人 |
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主权项 |
1. A method of operating a memory device, the memory device comprising at least one memory cell being on a semiconductor material, the semiconductor material being over a dielectric material, the method comprising:
biasing a boosting plate under the dielectric material to a non-ground voltage level as one step of operating the memory cell. |
地址 |
Boise ID US |