发明名称 |
PULSE AMPLITUDE MODULATION (PAM) BIT ERROR TEST AND MEASUREMENT |
摘要 |
<p>A method and apparatus are provided to detect a threshold-error of a multi-level signal-under-test. In one aspect of the disclosure, a digital test sequence may be used to produce the signal-under-test. In one aspect, the digital test sequence may be mapped to M binary reference sequences, wherein M is greater than one. In one aspect, each of the M binary reference sequences may be associated with a voltage threshold and a received signal may be bit-compared with each threshold. In one aspect, a threshold-error may be counted when a bit of a binary reference sequence does not match the corresponding bit-compare result. In one aspect, an instrument is provided that compares a received amplitude to a plurality of thresholds at one sample time.</p> |
申请公布号 |
WO2015109222(A1) |
申请公布日期 |
2015.07.23 |
申请号 |
WO2015US11807 |
申请日期 |
2015.01.16 |
申请人 |
TEKTRONIX, INC. AN OREGON US CORPORATION |
发明人 |
SCHOEN, KIPP, J.;ALLEN, JOSEPH, N. |
分类号 |
H04L1/24;G01R31/317;H04L1/20 |
主分类号 |
H04L1/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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