发明名称 半導体装置の製造方法
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method of activating an impurity by laser irradiation, which can inhibit formation of irregularity on a rear face of a semiconductor substrate. <P>SOLUTION: A semiconductor device manufacturing method comprises: preparing a semiconductor substrate 3a and performing an ion implantation process of ion implanting impurities for composing activation layers 12, 13 from a rear face of the semiconductor substrate 3a; subsequently, performing an activation process of scanning while irradiating from the rear face of the semiconductor substrate 3a simultaneously, a first laser beam 18a and a second laser beam 18b having energy lower than that of the first laser beam 18a and wavelength longer than that of the first laser beam 18a, with an irradiation spot overlapping a part of an irradiation spot of the first laser beam 18a, and activating the impurities by the first laser beam 18a to form the activation layers 12, 13. <P>COPYRIGHT: (C)2013,JPO&INPIT</p>
申请公布号 JP5751128(B2) 申请公布日期 2015.07.22
申请号 JP20110234083 申请日期 2011.10.25
申请人 发明人
分类号 H01L21/336;H01L21/265;H01L21/268;H01L27/04;H01L29/739;H01L29/78 主分类号 H01L21/336
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