发明名称 Expitaxial film on nanoscale structure
摘要 <p>An embodiment of the invention includes an epitaxial layer that directly contacts, for example, a nanowire, fin, or pillar in a manner that allows the layer to relax with two or three degrees of freedom. The epitaxial layer may be included in a channel region of a transistor. The nanowire, fin, or pillar may be removed to provide greater access to the epitaxial layer. Doing so may allow for a“all-around gate”structure where the gate surrounds the top, bottom, and sidewalls of the epitaxial layer. Other embodiments are described herein.</p>
申请公布号 GB201510001(D0) 申请公布日期 2015.07.22
申请号 GB20150010001 申请日期 2013.06.29
申请人 INTEL CORPORATION 发明人
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