发明名称 半導体装置
摘要 <p>A semiconductor device includes: a first semiconductor layer; a second semiconductor layer; a two-dimensional carrier gas layer; a source electrode; a drain electrode; a gate electrode; and an auxiliary electrode located above the two-dimensional carrier gas layer between the gate electrode and the drain electrode. Channel resistance of the two-dimensional carrier gas layer between the gate electrode and the auxiliary electrode is set higher than channel resistance of the two-dimensional carrier gas layer between the gate electrode and the source electrode.</p>
申请公布号 JP5751404(B2) 申请公布日期 2015.07.22
申请号 JP20100185780 申请日期 2010.08.23
申请人 发明人
分类号 H01L21/338;H01L21/28;H01L21/337;H01L29/417;H01L29/778;H01L29/808;H01L29/812 主分类号 H01L21/338
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