发明名称 CAPACITANCE MEASUREMENT OF HIGH VOLTAGE DEVICE
摘要 Described herein are systems and methods that facilitate the measurement of the capacitance of high voltage devices while shielding an active device involved in the measurement from the high voltage. The systems and methods employ capacitors to store the high voltage such that the active device does not experience the high voltage. Placement of a reset device ensures that the active device is shielded from the high voltage.
申请公布号 EP2895870(A1) 申请公布日期 2015.07.22
申请号 EP20130836303 申请日期 2013.08.16
申请人 SEMTECH CORPORATION 发明人 CHEVROULET, MICHEL ALAIN
分类号 G01R27/26 主分类号 G01R27/26
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