发明名称 欠陥検査装置
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an efficient defect inspection device that does not require a preparation process for special region detection for an inspection object conveyed continuously in a manufacture line, and can greatly shorten an inspection time. <P>SOLUTION: The defect inspection device detects a defect of a container having a seal part for closing an opening, and includes means of conveying the container, means of lighting up the container, means of imaging the container, means of outputting the timing of imaging, means of detecting a special region from a picked-up image, and inspection means of inspecting a defect with different thresholds for a plurality of regions in the special region. <P>COPYRIGHT: (C)2013,JPO&INPIT</p>
申请公布号 JP5750971(B2) 申请公布日期 2015.07.22
申请号 JP20110067492 申请日期 2011.03.25
申请人 发明人
分类号 G01N21/90 主分类号 G01N21/90
代理机构 代理人
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