发明名称 |
Automatic fixture removal using one-port measurement |
摘要 |
Scattering parameters of a test fixture having a first port and a second port are measured by providing a test instrument; outputting a one-port reflection test signal from the test instrument to the first port with the second port terminated in a reflective termination having a known reflection coefficient, and receiving at the test instrument a one-port reflection measurement signal from the first port; subjecting the one-port reflection measurement signal to first time gating to generate a first time-gated measurement signal, the first time gating using a first gating function temporally disposed about the first port; subjecting the one-port reflection measurement signal to second time gating to generate a second time-gated measurement signal, the second time gating using a second gating function temporally disposed about the termination; and deriving the scattering parameters from the first time-gated measurement signal and the second time-gated measurement signal. |
申请公布号 |
US9086376(B1) |
申请公布日期 |
2015.07.21 |
申请号 |
US201414156401 |
申请日期 |
2014.01.15 |
申请人 |
Keysight Technologies, Inc. |
发明人 |
Dunsmore Joel P.;Cheng Ning;Zhang Ya-Ping |
分类号 |
G01N21/47 |
主分类号 |
G01N21/47 |
代理机构 |
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代理人 |
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主权项 |
1. A system to measure scattering parameters of a test fixture having a first port and a second port, the system comprising:
an input to receive a first time-gated measurement signal and a second time-gated measurement signal obtained by subjecting a one-port measurement signal to time gating, the one-port measurement signal obtained from the first port of the test fixture with the second port of the test fixture terminated in a reflective termination having a known reflection coefficient, the first time-gated measurement signal obtained using a first gating function temporally disposed about the first port, the second time-gated measurement signal obtained using a second gating function temporally disposed about the reflective termination; a first port return loss generator to generate from the first time-gated measurement signal a first port return loss for the test fixture; an insertion loss generator to generate from the second time-gated measurement signal and the reflection coefficient a two-way insertion loss, a first port reverse insertion loss, and a first port forward insertion loss for the test fixture; and a second port return loss generator to generate a second-port return loss for the test fixture from the first port return loss, the two-way insertion loss, the first port reverse insertion loss, the first port forward insertion loss, and the reflection coefficient. |
地址 |
Santa Rosa CA US |