| 发明名称 | Determining a material property based on scattered radiation | ||
| 摘要 | Radiation is directed at an object, and radiation scattered by the object is sensed. An angular distribution of scatter in the sensed scattered radiation relative to a path of the radiation directed at the object is determined, and the angular distribution is evaluated. One or more atomic numbers, or effective atomic numbers, of materials composing the object is determined based on evaluating the angular distribution. | ||
| 申请公布号 | US9086366(B2) | 申请公布日期 | 2015.07.21 |
| 申请号 | US201313766239 | 申请日期 | 2013.02.13 |
| 申请人 | L-3 Communications Security and Detection Systems, Inc. | 发明人 | Schmitt Michael H. |
| 分类号 | G01N23/201;G01N23/20 | 主分类号 | G01N23/201 |
| 代理机构 | Fish & Richardson P.C. | 代理人 | Fish & Richardson P.C. |
| 主权项 | 1. A method comprising: directing x-ray radiation at an object; sensing x-ray radiation scattered by the object; determining an angular distribution of scatter in the sensed scattered radiation relative to a path of the radiation directed at the object; determining a measurement of a density of the object; estimating, based on the measurement of the density of the object, an amount of attenuation of the radiation caused by the object; evaluating the angular distribution based at least on accounting for the estimated amount of attenuation; and determining one or more atomic numbers, or effective atomic numbers, of materials composing the object based on evaluating the angular distribution. | ||
| 地址 | Woburn MA US | ||