发明名称 Tantalum sputtering target
摘要 Provided is a tantalum sputtering target, in which 1 mass ppm or more and 50 mass ppm or less of boron is contained as an essential component, and of which the purity excluding boron and gas components is 99.998% or higher. Thereby obtained is a high-purity tantalum sputtering target having a uniform and fine structure and enabling plasma stabilization and achievement of superior film evenness (uniformity).
申请公布号 US9085819(B2) 申请公布日期 2015.07.21
申请号 US201113805946 申请日期 2011.07.21
申请人 JX Nippon Mining & Metals Corporation 发明人 Senda Shinichiro;Fukushima Atsushi
分类号 C23C14/34;C22C1/02;C22C27/02;C22F1/18 主分类号 C23C14/34
代理机构 Howson & Howson LLP 代理人 Howson & Howson LLP
主权项 1. A tantalum sputtering target, consisting of 1 mass ppm or more and 50 mass ppm or less of boron and tantalum of a purity, excluding boron and gas components, of 99.998% or higher.
地址 Tokyo JP