发明名称 |
Semiconductor structure and method for manufacturing the same |
摘要 |
A semiconductor structure and a method for manufacturing the same are provided. The method comprises following steps. A first silicon-containing conductive material is formed on a substrate. A second silicon-containing conductive material is formed on the first silicon-containing conductive material. The first silicon-containing conductive material and the second silicon-containing conductive material have different dopant conditions. The first silicon-containing conductive material and the second silicon-containing conductive material are thermally oxidized for turning the first silicon-containing conductive material wholly into an insulating oxide structure, and the second silicon-containing conductive material into a silicon-containing conductive structure and an insulating oxide layer. |
申请公布号 |
US9087825(B2) |
申请公布日期 |
2015.07.21 |
申请号 |
US201314049253 |
申请日期 |
2013.10.09 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
Lue Hang-Ting;Hsiao Yi-Hsuan |
分类号 |
H01L23/485;H01L27/115;H01L29/423;H01L29/792;H01L23/00 |
主分类号 |
H01L23/485 |
代理机构 |
McClure, Qualey & Rodack, LLP |
代理人 |
McClure, Qualey & Rodack, LLP |
主权项 |
1. A semiconductor structure, comprising:
a substrate; an insulating oxide structure formed on the substrate; and a plurality of silicon-containing conductive structures separated from each other by the insulating oxide structure and each of the silicon-containing conductive structures is functioned as a bit line (BL), wherein at least one of the insulating oxide structure and the silicon-containing conductive structure has a bird's beak profile, each of the insulating oxide structures has a contacting end contacting to the insulating structure, and the bird's beak profile forms a decreasing width toward the contacting end in the insulating oxide structure and the silicon-containing conductive structure. |
地址 |
Hsinchu TW |