Prediction of circuit performance variations due to device mismatch

摘要

Aspects of the invention relate to techniques for predicting circuit performance variations due to device mismatch. Circuit simulation is performed to generate circuit simulation results based on a circuit description and information of circuit element parameters. Based on the simulation results, sensitivity information for the circuit design and current/charge deviations caused by individual circuit element parameter variations may be computed. Based on the sensitivity information and the current/charge deviations, steady-state mismatch effect information is determined. The determination may comprise first computing output parameter deviations caused by the individual variations of the circuit element parameters and then computing a total output parameter deviation based on the output parameter deviations.

主权项

1. One or more processor-readable storage media storing computer-executable instructions for causing one or more processors to perform a method, the method comprising:
receiving a circuit description of a circuit design that comprises circuit elements and information of circuit element parameters for the circuit elements; performing circuit simulation using the circuit description and the information of circuit element parameters to generate circuit simulation results; computing sensitivity information based on the circuit simulation results; computing, based on the circuit simulation results, current/charge deviations caused by individual circuit element parameter variations; determining steady-state mismatch effect information based on the sensitivity information and the current/charge deviations; and outputting the steady-state mismatch effect information.