发明名称 |
Semiconductor device |
摘要 |
A semiconductor device comprising: an active layer, which has a composition represented by the formula: AlxMyGa1-x-yN, wherein x satisfies 0≦x≦1, wherein y satisfies 0≦y≦1, wherein x+y satisfies 0≦x+y≦1, and wherein M contains at least one of In and B; a substrate containing GaN; and a buffer layer provided between the active layer and the substrate, wherein the semiconductor device is operated by electrical current flowing through the active layer in a direction parallel to a face of the substrate, wherein the buffer layer has a composition represented by the formula: AlpIn1-pN, wherein p satisfies 0≦p<1, and wherein the buffer layer, which has a band gap energy wider than that of the substrate, and which is lattice-matched to the substrate. |
申请公布号 |
US9087890(B2) |
申请公布日期 |
2015.07.21 |
申请号 |
US201012859856 |
申请日期 |
2010.08.20 |
申请人 |
Sanken Electric Co., LTD. |
发明人 |
Sato Ken |
分类号 |
H01L29/15;H01L29/778;H01L29/66;H01L29/47 |
主分类号 |
H01L29/15 |
代理机构 |
Banner & Witcoff, Ltd. |
代理人 |
Banner & Witcoff, Ltd. |
主权项 |
1. A semiconductor device comprising:
an active layer, which has a composition represented by the formula:
AlxMyGa1-x-yN,wherein x satisfies 0≦x≦1,wherein y satisfies 0≦y≦1,wherein x+y satisfies 0≦x+y≦1, andwherein M contains at least one of In and B; a substrate containing GaN; and a buffer layer provided between the active layer and a face of the substrate, wherein the semiconductor device is operated by electrical current flowing through the active layer in a direction parallel to the face of the substrate, wherein the buffer layer has a composition represented by the formula:
AlpIn1-pN, wherein p satisfies 0≦p<1, and wherein the buffer layer has a band gap energy wider than that of the substrate and is lattice-matched to the substrate, wherein a composition ratio of Al and a composition ratio of In in the buffer layer change in a thickness direction such that the buffer layer is lattice-matched to the substrate, and wherein the composition ratio of Al changes due to a change in the composition ratio of In and the composition ratio of In changes due to a change in the composition ratio of Al. |
地址 |
Niiza-shi, Saitama JP |