发明名称 Method for crystallizing a silicon substrate
摘要 A method for crystallizing a silicon substrate includes manufacturing a crystallized silicon test substrate that is crystallized by scanning excimer laser annealing beams with different energy densities on respective areas of an amorphous silicon test substrate, irradiating a surface of the crystallized silicon test substrate using a light source, and measuring reflectivity corresponding to the respective areas of the crystallized silicon test substrate in a visible light wavelength range, extracting average reflectivities of the respective areas of the crystallized silicon test substrate in wavelength ranges corresponding to respective colors, calculating an optimum energy density (OPED) index per energy density by using a value acquired by subtracting average reflectivity of red-based colors from average reflectivity of blue-based colors, selecting an optimal energy density, and crystallizing an amorphous silicon substrate using the optimal energy density.
申请公布号 US9087697(B2) 申请公布日期 2015.07.21
申请号 US201313890476 申请日期 2013.05.09
申请人 SAMSUNG DISPLAY CO., LTD. 发明人 Kim Sung-Ho;Choi Min-Hwan;Baek Min-Ji;Lee Sang-Kyung;Jeon Sang-Ho;Huh Jong-Moo
分类号 H01L21/02;H01L21/66 主分类号 H01L21/02
代理机构 Lee & Morse, P.C. 代理人 Lee & Morse, P.C.
主权项 1. A method for crystallizing a silicon substrate, the method comprising: manufacturing a crystallized silicon test substrate that is crystallized by scanning excimer laser annealing beams with different energy densities on respective areas of an amorphous silicon test substrate; irradiating a surface of the crystallized silicon test substrate using a light source in a visible light wavelength range, and measuring reflectivity corresponding to the respective areas of the crystallized silicon test substrate in the visible light wavelength range; extracting average reflectivities of the respective areas of the crystallized silicon test substrate in a plurality of wavelength ranges corresponding to respective colors; calculating an optimum energy density (OPED) index for each of the different energy densities by using a value that is acquired by subtracting average reflectivity of red-based colors from average reflectivity of blue-based colors for the respective areas from among the extracted average reflectivities for the respective colors; selecting an optimal energy density by comparing the OPED indexes calculated for each of the different energy densities; and crystallizing an amorphous silicon substrate using the optimal energy density, wherein calculating an OPED index includes calculating the OPED per energy density by applying a different weight value to each average reflectivity per color, and in subtracting the average reflectivity of red-based colors from the average reflectivity of blue-based colors, a weight value that is from 1 to 10 is applied to blue and cyan, and a weight value that is from 0.1 to 1 is applied to green, yellow, orange, and red.
地址 Yongin, Gyeonggi-Do KR