Systems and methods for detecting and/or identifying materials

摘要

One embodiment of the invention includes a material detection system. The system includes a sensor system configured to collect radiation from a region of interest. The collected radiation can include a plurality of frequency bands. The system also includes a processing unit configured to detect a material of interest. The material of interest can be a concealed dielectric material, and the processing unit can be configured to decompose the collected radiation into natural resonance signals to analyze the natural resonance signals to detect an anomaly corresponding to the concealed dielectric material based on wave characteristics of the natural resonance signals. The processing unit could also include processing layers associated with the plurality of frequency bands for detecting and identifying the material of interest based on wave characteristics associated with each of the plurality of frequency bands of the collected radiation.

主权项

1. A material detection system comprising:
a sensor system configured to collect radiation from a region of interest; and a processing unit configured to decompose the collected radiation into natural resonance signals, to analyze the natural resonance signals to identify poles and a residue in the natural resonance signals, to implement an algorithm to extract an observation angle of the collected radiation based on characteristics of the poles and the residue in the natural resonance signals, and to detect an anomaly corresponding to a concealed dielectric material based on calculating at least one dielectric constant associated with the concealed dielectric material based on wave characteristics of the natural resonance signals and based on the extracted observation angle, and to identify the dielectric material by comparing the at least one dielectric constant with dielectric constant data stored in a database.