发明名称 X-ray obscuration film and related techniques
摘要 An X-ray obscuration (XRO) film comprising one or more metallic wire mesh layers and an adjacent layer of indium foil having portions which extend into openings of the wire mesh and in contact with metallic portions thereof. The XRO film can be capable of absorbing at least a portion of X-ray energy thereby creating an interference pattern when the XRO film is coupled with an electronic circuit and placed between an X-ray source and an X-ray detector and subjected to radiographic inspection. The interference pattern can create sufficient visual static to effectively obscure circuit lines in the electronic circuit when subjected to radiographic inspection techniques. The XRO film can be substantially thinner than existing solutions for preventing X-ray inspection with an exemplary embodiment being no more than 5 mils thick. The metallic XRO film can also provide electromagnetic shielding and/or heat dissipation for electronic circuits.
申请公布号 US9087617(B2) 申请公布日期 2015.07.21
申请号 US201414325670 申请日期 2014.07.08
申请人 Lockheed Martin Corporation 发明人 Gonya Stephen;Iannon Jesse
分类号 G21F1/12;G21F3/00;H05K1/02;H01L23/00 主分类号 G21F1/12
代理机构 Miles & Stockbridge PC 代理人 Miles & Stockbridge PC ;Carmichael James T.
主权项 1. An obscured electronic device comprising: an electronic circuit including a plurality of circuit lines; and an obscuration film coupled to the electronic circuit, the obscuration film comprising a wire mesh, andan adjacent layer of material having portions which extend into openings of the wire mesh and in contact with portions thereof, wherein the obscuration film is configured to absorb at least a portion of electromagnetic radiation energy and to create an interference pattern obscuring the plurality of circuit lines of the electronic circuit when the device is placed between an electromagnetic radiation source and an electromagnetic radiation detector.
地址 Bethesda MD US