发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
An embodiment of a compound semiconductor device includes: a first lower electrode; a first insulating film over the first lower electrode; a first upper electrode over the first insulating film; a second lower electrode separate from the first lower electrode; a second insulating film over the second lower electrode; a third insulating film over the second insulating film; and a second upper electrode over on the third insulating film. A thickness of the first insulating film is substantially the same as a thickness of the third insulating film, a contour of the third insulating film in planar view is outside a contour of the second insulating film in planar view, and a contour of the second upper electrode in planar view is inside the contour of the second insulating film in planar view. |
申请公布号 |
US2015200197(A1) |
申请公布日期 |
2015.07.16 |
申请号 |
US201414579394 |
申请日期 |
2014.12.22 |
申请人 |
FUJITSU SEMICONDUCTOR LIMITED |
发明人 |
Saito Hitoshi |
分类号 |
H01L27/115;H01L27/108;H01L49/02 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a first lower electrode; a first insulating film over the first lower electrode; a first upper electrode over the first insulating film; a second lower electrode separate from the first lower electrode; a second insulating film over the second lower electrode; a third insulating film over the second insulating film; and a second upper electrode over on the third insulating film, wherein: a thickness of the first insulating film is substantially the same as a thickness of the third insulating film; a contour of the third insulating film in planar view is outside a contour of the second insulating film in planar view; and a contour of the second upper electrode in planar view is inside the contour of the second insulating film in planar view. |
地址 |
Yokohama-shi JP |