发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 An embodiment of a compound semiconductor device includes: a first lower electrode; a first insulating film over the first lower electrode; a first upper electrode over the first insulating film; a second lower electrode separate from the first lower electrode; a second insulating film over the second lower electrode; a third insulating film over the second insulating film; and a second upper electrode over on the third insulating film. A thickness of the first insulating film is substantially the same as a thickness of the third insulating film, a contour of the third insulating film in planar view is outside a contour of the second insulating film in planar view, and a contour of the second upper electrode in planar view is inside the contour of the second insulating film in planar view.
申请公布号 US2015200197(A1) 申请公布日期 2015.07.16
申请号 US201414579394 申请日期 2014.12.22
申请人 FUJITSU SEMICONDUCTOR LIMITED 发明人 Saito Hitoshi
分类号 H01L27/115;H01L27/108;H01L49/02 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor device, comprising: a first lower electrode; a first insulating film over the first lower electrode; a first upper electrode over the first insulating film; a second lower electrode separate from the first lower electrode; a second insulating film over the second lower electrode; a third insulating film over the second insulating film; and a second upper electrode over on the third insulating film, wherein: a thickness of the first insulating film is substantially the same as a thickness of the third insulating film; a contour of the third insulating film in planar view is outside a contour of the second insulating film in planar view; and a contour of the second upper electrode in planar view is inside the contour of the second insulating film in planar view.
地址 Yokohama-shi JP