发明名称 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
摘要 The present invention provides a semiconductor structure, including a substrate, having a dielectric layer disposed thereon, a first device region and a second device region defined thereon, at least one first trench disposed in the substrate within the first device region, at least one second trench and at least one third trench disposed in the substrate within the second device region, a work function layer, disposed in the second trench and the third trench, wherein the work function layer partially covers the sidewall of the second trench, and entirely covers the sidewall of the third trench, and a first material layer, disposed in the second trench and the third trench, wherein the first material layer covers the work function layer disposed on partial sidewall of the second trench, and entirely covers the work function layer disposed on the sidewall of the third trench.
申请公布号 US2015200192(A1) 申请公布日期 2015.07.16
申请号 US201414153079 申请日期 2014.01.13
申请人 UNITED MICROELECTRONICS CORP. 发明人 Tsao Po-Chao;Huang Yao-Hung;Lin Chien-Ting;Wei Ming-Te
分类号 H01L27/092;H01L21/8238;H01L21/321;H01L21/02 主分类号 H01L27/092
代理机构 代理人
主权项 1. A semiconductor structure, comprising: a substrate, having a dielectric layer disposed thereon, a first device region and a second device region defined thereon; at least one first trench disposed in the dielectric layer within the first device region, at least one second trench and at least one third trench disposed in the substrate within the second device region; a first work function layer, disposed in the second trench and the third trench, wherein the first work function layer partially covers the sidewall of the second trench, and entirely covers the sidewall and a bottom of the third trench; and a plurality of first material layers, disposed in the second trench and the third trench, wherein the first material layer covers the first work function layer disposed on partial sidewall of the second trench, and entirely covers the first work function layer disposed on the sidewall and the bottom of the third trench.
地址 HSIN-CHU CITY TW
您可能感兴趣的专利