发明名称 METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 The performances of semiconductor elements disposed in a multilayer wiring layer are improved. A semiconductor device includes: a first wire disposed in a first wiring layer; a second wire disposed in a second wiring layer stacked over the first wiring layer; a gate electrode arranged between the first wire and the second wire in the direction of stacking of the first wiring layer and the second wiring layer, and not coupled with the first wire and the second wire; a gate insulation film disposed over the side surface of the gate electrode; and a semiconductor layer disposed over the side surface of the gate electrode via the gate insulation film, and coupled with the first wire and the second wire.
申请公布号 US2015200135(A1) 申请公布日期 2015.07.16
申请号 US201514667915 申请日期 2015.03.25
申请人 Renesas Electronics Corporation 发明人 SUNAMURA Hiroshi;INOUE Naoya;KANEKO Kishou
分类号 H01L21/768;H01L29/66 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method for manufacturing a semiconductor device, comprising the steps of: forming a first wiring layer having a first wire over a semiconductor substrate, forming a gate electrode not coupled with the first wire over the first wiring layer, forming a gate insulation film over the side surface of the gate electrode, forming a semiconductor layer coupled with the first wire via the gate insulation film, over the side surface of the gate electrode, and forming a second wiring layer having a second wire not coupled with the gate electrode, and coupled with the semiconductor layer, over the first wiring layer.
地址 Kanagawa JP