发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
Provided are a semiconductor device and a method for fabricating the same. The semiconductor device includes a semiconductor substrate, an interlayer insulating layer formed on the semiconductor substrate, a gate structure formed in the interlayer insulating layer, an isolation layer formed in the semiconductor substrate, a through-silicon via formed to penetrate the semiconductor substrate, the interlayer insulating layer, and the isolation layer, and a first conduction type first impurity region coming in contact with the isolation layer and formed to surround only a portion of a sidewall of the through-silicon via in the semiconductor substrate. |
申请公布号 |
US2015200152(A1) |
申请公布日期 |
2015.07.16 |
申请号 |
US201414526479 |
申请日期 |
2014.10.28 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
KANG Sin-Woo;CHO Sung-Dong |
分类号 |
H01L23/48;H01L29/06;H01L27/04;H01L29/78 |
主分类号 |
H01L23/48 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a semiconductor substrate including a first region and a second region; an interlayer insulating layer formed on the semiconductor substrate; a semiconductor element formed on the semiconductor substrate in the first region, the semiconductor element including a gate structure formed in the interlayer insulating layer; an isolation layer formed in the semiconductor substrate in the second region; a through-silicon via formed to penetrate the semiconductor substrate, the interlayer insulating layer, and the isolation layer in the second region; and a first conduction type first impurity region contacting with the isolation layer and formed to surround only a portion of a sidewall of the through-silicon via in the semiconductor substrate in the second region. |
地址 |
Suwon-si KR |