发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 Provided are a semiconductor device and a method for fabricating the same. The semiconductor device includes a semiconductor substrate, an interlayer insulating layer formed on the semiconductor substrate, a gate structure formed in the interlayer insulating layer, an isolation layer formed in the semiconductor substrate, a through-silicon via formed to penetrate the semiconductor substrate, the interlayer insulating layer, and the isolation layer, and a first conduction type first impurity region coming in contact with the isolation layer and formed to surround only a portion of a sidewall of the through-silicon via in the semiconductor substrate.
申请公布号 US2015200152(A1) 申请公布日期 2015.07.16
申请号 US201414526479 申请日期 2014.10.28
申请人 Samsung Electronics Co., Ltd. 发明人 KANG Sin-Woo;CHO Sung-Dong
分类号 H01L23/48;H01L29/06;H01L27/04;H01L29/78 主分类号 H01L23/48
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor substrate including a first region and a second region; an interlayer insulating layer formed on the semiconductor substrate; a semiconductor element formed on the semiconductor substrate in the first region, the semiconductor element including a gate structure formed in the interlayer insulating layer; an isolation layer formed in the semiconductor substrate in the second region; a through-silicon via formed to penetrate the semiconductor substrate, the interlayer insulating layer, and the isolation layer in the second region; and a first conduction type first impurity region contacting with the isolation layer and formed to surround only a portion of a sidewall of the through-silicon via in the semiconductor substrate in the second region.
地址 Suwon-si KR