发明名称 METHODS OF FORMING CONDUCTIVE PATTERNS AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES USING THE SAME
摘要 The present disclosure herein relates to methods of forming conductive patterns and to methods of manufacturing semiconductor devices using the same. In some embodiments, a method of forming a conductive pattern includes forming a first conductive layer and a second conductive layer on a substrate. The first conductive layer and the second conductive layer may include a metal nitride and a metal, respectively. The first conductive layer and the second conductive layer may be etched using an etchant composition that includes phosphoric acid, nitric acid, an assistant oxidant and a remainder of water. The etchant composition may have substantially the same etching rate for the metal nitride and the metal.
申请公布号 US2015200112(A1) 申请公布日期 2015.07.16
申请号 US201414492122 申请日期 2014.09.22
申请人 Samsung Electronics Co., Ltd. ;Soulbrain Co., Ltd. 发明人 Han Hoon;Yoon Byoung-Moon;Hong Young-Taek;Kim Keon-Young;Yang Jun-Youl;Kim Young-Ok;Kim Tae-Heon;Song Sun-Joong;Lim Jung-Hun;Park Jae-Wan;Lee Jin-Uk
分类号 H01L21/3213;H01L29/423;C23F1/16;H01L21/02 主分类号 H01L21/3213
代理机构 代理人
主权项 1. A method of forming a conductive pattern, comprising: forming a first conductive layer and a second conductive layer on a substrate, the first conductive layer including a metal nitride and the second conductive layer including a metal; and etching the first conductive layer and the second conductive layer using an etchant composition that includes phosphoric acid, nitric acid, an assistant oxidant and water, the etchant composition having substantially the same etching rate for the metal nitride and the metal.
地址 Suwon-si KR