| 发明名称 |
Wide Interposer for an Electronic Testing System |
| 摘要 |
A test interposer includes an interposer layer configured to receive a test socket, and a stiffening layer attached to the interposer layer so that the interposer layer is kept in an unalterable shape. |
| 申请公布号 |
US2015198633(A1) |
申请公布日期 |
2015.07.16 |
| 申请号 |
US201414157181 |
申请日期 |
2014.01.16 |
| 申请人 |
Infineon Technologies AG |
发明人 |
Rizza Rianda |
| 分类号 |
G01R1/073;G01R1/04;G01R31/28 |
主分类号 |
G01R1/073 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A test interposer for an electronic testing system, the test interposer comprising:
an interposer layer configured to receive a test socket; and a stiffening layer attached to the interposer layer so that the interposer layer is kept in an unalterable shape. |
| 地址 |
Neubiberg DE |
