发明名称 METHOD OF SAMPLING FEATURE POINTS, IMAGE MATCHING METHOD USING THE SAME, AND IMAGE MATCHING APPARATUS
摘要 A method of sampling feature points, an image matching method using the same, and an image matching processor are disclosed. The method of sampling feature points for image matching includes: dividing a first image into a plurality of regions corresponding to a number of feature points to be sampled; extracting a sampled feature point from each of the regions such that a distance between a sampled feature point of one region and a sampled feature point of another region satisfies a predetermined condition; and estimating a homography on the basis of the extracted sampled feature points and corresponding sampled feature points of a second image to be matched with the first image.
申请公布号 US2015199585(A1) 申请公布日期 2015.07.16
申请号 US201414583909 申请日期 2014.12.29
申请人 SAMSUNG TECHWIN CO., LTD. 发明人 OH Jaeyoon;LEE Joonsung;PARK Jaewoo
分类号 G06K9/46;G06K9/62 主分类号 G06K9/46
代理机构 代理人
主权项 1. A method of sampling feature points for image matching, the method comprising: dividing a first image into a plurality of regions corresponding to a number of feature points to be sampled; extracting a sampled feature point from each of the regions such that a distance between a sampled feature point of one region and a sampled feature point of another region satisfies a predetermined condition; and estimating a homography on the basis of the extracted sampled feature points and corresponding sampled feature points of a second image to be matched with the first image.
地址 Changwon-si KR