发明名称 VISUAL INSPECTION DEVICE AND VISUAL INSPECTION METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a visual inspection device which properly detects a defect generated in an inspection area, and a visual inspection method.SOLUTION: A visual inspection device includes: an image acquisition device which acquires an appearance image of a surface to be inspected by generating different luminance intensities in an inspection area and a non-inspection area; and an image processing device which identifies a position of the non-inspection area in the appearance image by use of a difference in luminance between the inspection area and the non-inspection area, and forms a detection image by using the same luminance in the inspection area and the non-inspection area in the appearance image. An object is visually inspected by use of the detection image.</p>
申请公布号 JP2015129662(A) 申请公布日期 2015.07.16
申请号 JP20140000766 申请日期 2014.01.07
申请人 SHIMADZU CORP 发明人 FUJIWARA TADAYUKI
分类号 G01N21/956 主分类号 G01N21/956
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