发明名称 |
Fluorine-Containing Sulfonic Acid Salt, Fluorine-Containing Sulfonic Acid Salt Resin, Resist Composition, and Pattern Forming Method Using Same |
摘要 |
Disclosed is a fluorine-containing sulfonic acid salt resin having a repeating unit represented by the following general formula (3). In the formula, each A independently represents a hydrogen atom, a fluorine atom or a trifluoromethyl group, and n represents an integer of 1-10. W represents a bivalent linking group, R01 represents a hydrogen atom or a monovalent organic group, and M+ represents a monovalent cation. A resist composition containing this resin is further superior in sensitivity, resolution and reproducibility of mask pattern and is capable of forming a pattern with a low LER.; |
申请公布号 |
US2015198879(A1) |
申请公布日期 |
2015.07.16 |
申请号 |
US201314374010 |
申请日期 |
2013.01.17 |
申请人 |
Central Glass Company, Limited |
发明人 |
Mori Kazunori;Narizuka Satoru;Hagiwara Yuji;Amemiya Fumihiro;Fujiwara Masaki |
分类号 |
G03F7/038;C07C309/10;G03F7/20;C07C303/22;C07D327/04;C07D307/20;C07D307/93 |
主分类号 |
G03F7/038 |
代理机构 |
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代理人 |
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主权项 |
1. A fluorine-containing sulfonic acid salt resin having a repeating unit represented by the following general formula (3), wherein each A independently represents a hydrogen atom, a fluorine atom or a trifluoromethyl group, n represents an integer of 1-10, W represents a bivalent linking group, R01 represents a hydrogen atom or a monovalent organic group, and M+ represents a monovalent cation. |
地址 |
Ube-shi, Yamaguchi JP |