发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can increase a donor generation rate by proton radiation to improve electrical characteristics.SOLUTION: In a semiconductor device, hydrogen atoms 14 and crystal defects 15 are introduced into the inside of an ntype semiconductor substrate 1 by proton implantation 13; crystal defects 12 are generated inside the ntype semiconductor substrate 1 by electron beam irradiation 11 before proton implantation 13 or after proton implantation 13; subsequently a heat treatment for donor generation is performed; by controlling a quantity of the crystal defects 12, 15 to be optimal during the heat treatment for donor generation, a donor generation rate can be increased; at the end of the heat treatment for donor generation, by recovering the crystal defects 12, 15 formed by electronic beam irradiation 11 and proton implantation 13 and by controlling a quantity of the crystal defects to be optimal, improvement in withstand voltage and reduction in leakage current can be achieved.
申请公布号 JP2015130524(A) 申请公布日期 2015.07.16
申请号 JP20150046522 申请日期 2015.03.09
申请人 FUJI ELECTRIC CO LTD 发明人 YOSHIMURA TAKASHI;MIYAZAKI MASAYUKI;TAKISHITA HIROSHI;KURIBAYASHI HIDENAO
分类号 H01L29/861;H01L21/265;H01L21/322;H01L21/336;H01L29/06;H01L29/739;H01L29/78;H01L29/868 主分类号 H01L29/861
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