发明名称 Metal Capping Process And Processing Platform Thereof
摘要 Before depositing a metal capping layer on a metal interconnect in a damascene structure, a remote plasma is used to reduce native oxide formed on the metal interconnect. Accordingly, a remote plasma reducing chamber is integrated in a processing platform for depositing a metal capping layer.
申请公布号 US2015200132(A1) 申请公布日期 2015.07.16
申请号 US201414155695 申请日期 2014.01.15
申请人 Taiwan Semiconductor Manufacturing CO., LTD. 发明人 Chi Chih-Chien;Tung Szu-Ping;Huang Hung-Yi;Hsieh Ching-Hua
分类号 H01L21/768;H01L21/67;C23C16/06;C23C16/50;C23C16/44;C23C16/02 主分类号 H01L21/768
代理机构 代理人
主权项 1. A processing platform for metal capping process, comprising: a transfer chamber equipped with a robot for transferring a wafer; a load lock chamber for facilitating transfer of the wafer between a vacuum environment of the transfer chamber and an ambient environment outside the processing platform; a remote plasma reducing chamber connected to the transfer chamber, wherein the remote plasma reducing chamber is used for reducing native oxide on metal interconnects on the wafer; and a deposition chamber connected to the transfer chamber, wherein the deposition chamber is used for depositing metal capping layers respectively on the reduced metal interconnects.
地址 Hsinchu TW