发明名称 |
Metal Capping Process And Processing Platform Thereof |
摘要 |
Before depositing a metal capping layer on a metal interconnect in a damascene structure, a remote plasma is used to reduce native oxide formed on the metal interconnect. Accordingly, a remote plasma reducing chamber is integrated in a processing platform for depositing a metal capping layer. |
申请公布号 |
US2015200132(A1) |
申请公布日期 |
2015.07.16 |
申请号 |
US201414155695 |
申请日期 |
2014.01.15 |
申请人 |
Taiwan Semiconductor Manufacturing CO., LTD. |
发明人 |
Chi Chih-Chien;Tung Szu-Ping;Huang Hung-Yi;Hsieh Ching-Hua |
分类号 |
H01L21/768;H01L21/67;C23C16/06;C23C16/50;C23C16/44;C23C16/02 |
主分类号 |
H01L21/768 |
代理机构 |
|
代理人 |
|
主权项 |
1. A processing platform for metal capping process, comprising:
a transfer chamber equipped with a robot for transferring a wafer; a load lock chamber for facilitating transfer of the wafer between a vacuum environment of the transfer chamber and an ambient environment outside the processing platform; a remote plasma reducing chamber connected to the transfer chamber, wherein the remote plasma reducing chamber is used for reducing native oxide on metal interconnects on the wafer; and a deposition chamber connected to the transfer chamber, wherein the deposition chamber is used for depositing metal capping layers respectively on the reduced metal interconnects. |
地址 |
Hsinchu TW |