发明名称 AUTO FOCUS METHOD AND AUTO FOCUS APPARATUS
摘要 An auto focus (AF) method adapted to an AF apparatus is provided. The AF method includes following steps. A first image is captured by using the first image sensor. At least one characteristic is detected based on the first image, and whether the characteristic meets a predetermined condition is determined. If the characteristic meets the predetermined condition, a focus depth is calculated according to a three-dimensional (3D) depth information and movement of a first lens of the first sensor is driven according to the focus depth for focusing. If the characteristic does not meet the predetermined condition, the first lens is driven to move for many times to obtain a plurality of contrast values, such that movement of the first lens is driven according to the contrast values for focusing. Additionally, an AF apparatus is provided.
申请公布号 US2015201182(A1) 申请公布日期 2015.07.16
申请号 US201514670419 申请日期 2015.03.27
申请人 Altek Semiconductor Corp. 发明人 Chang Wen-Yan;Huang Yu-Chen;Chou Hong-Long;Kang Chung-Chia;Chao Shan-Lung
分类号 H04N13/02;H04N5/232 主分类号 H04N13/02
代理机构 代理人
主权项 1. An auto focus (AF) method, adapted to an AF apparatus, wherein the AF apparatus comprises a first image sensor and a second image sensor, the AF method comprising: capturing a first image by using the first image sensor; detecting at least one characteristic based on the first image, and determining whether the characteristic meets a predetermined condition; if the characteristic meets the predetermined condition, calculating a focus depth according to a three-dimensional (3D) depth information and driving movement of a first lens of the first sensor according to the focus depth for focusing; and if the characteristic does not meet the predetermined condition, driving the first lens to move for many times to obtain a plurality of contrast values, so as to drive movement of the first lens according to the contrast values for focusing.
地址 Hsinchu City TW