发明名称 |
METHOD AND SYSTEM OF TESTING FLAT PANEL DISPLAY INCLUDING ARRAY OF PIXELS AND PERIPHERAL CIRCUIT |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method for ensuring proper functionality of a panel prior to LC material injection or OLED material deposition to maximize productivity.SOLUTION: A method of testing a flat panel display including an array of pixels and a peripheral circuit configured to provide signals to the pixels is disclosed. The method includes registering 710 a VIOS test head to a panel, applying at least one test signal to the peripheral circuit, acquiring 720 one or more voltage images of the peripheral circuit, and detecting 740 a defect in the peripheral circuit on the basis of the acquired voltage images.</p> |
申请公布号 |
JP2015129912(A) |
申请公布日期 |
2015.07.16 |
申请号 |
JP20140206250 |
申请日期 |
2014.10.07 |
申请人 |
PHOTON DYNAMICS INC |
发明人 |
LEE CHANG HEE;JAMES LEE;KIM SANG JIN;JONGHO LEE;MICHAEL SEAN CASSADY;NICKOLAY MOKICHEV;KENT NGUYEN;DANIEL TOET |
分类号 |
G09F9/00;G01R31/316;G02F1/13;G02F1/133;G02F1/1368 |
主分类号 |
G09F9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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