发明名称 METHOD AND SYSTEM OF TESTING FLAT PANEL DISPLAY INCLUDING ARRAY OF PIXELS AND PERIPHERAL CIRCUIT
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for ensuring proper functionality of a panel prior to LC material injection or OLED material deposition to maximize productivity.SOLUTION: A method of testing a flat panel display including an array of pixels and a peripheral circuit configured to provide signals to the pixels is disclosed. The method includes registering 710 a VIOS test head to a panel, applying at least one test signal to the peripheral circuit, acquiring 720 one or more voltage images of the peripheral circuit, and detecting 740 a defect in the peripheral circuit on the basis of the acquired voltage images.</p>
申请公布号 JP2015129912(A) 申请公布日期 2015.07.16
申请号 JP20140206250 申请日期 2014.10.07
申请人 PHOTON DYNAMICS INC 发明人 LEE CHANG HEE;JAMES LEE;KIM SANG JIN;JONGHO LEE;MICHAEL SEAN CASSADY;NICKOLAY MOKICHEV;KENT NGUYEN;DANIEL TOET
分类号 G09F9/00;G01R31/316;G02F1/13;G02F1/133;G02F1/1368 主分类号 G09F9/00
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